Memory Component and Module Test Solutions
Quick Overview
The Award Winning M5512 GDDR7 Memory Test System is a category-creating solution for characterizing and functionally testing memory integrated circuits based on the JEDEC Graphics Double Data Rate 7 SGRAM Standard (GDDR7). Featuring high-speed, bidirectional PAM3 signaling, low-speed NRZ signaling, and complete protocol training capability, this solution is the optimal tool to help bring next-generation graphics memory to the industry. Access to every PIN and Memory Cell! The 55xx platform can be configured with varying channel counts to best adapt to your budget and requirement.
Virtual Memory Controller
The M5512 is powered by the versatile Pinetree software environment. Combining this category-creating solution with our software allows you to bring up any GDDR7 memory devices, debug protocol errors, and much more. Focus on your test algorithms and let the M5512 virtual memory controller manage the protocol.
Award Winning!
PRODUCT OF THE YEAR AWARD 2024
Awarded at the Electronics Industry Awards, as the Test, Measurement & Inspection Product of the Year 2024. Learn More
BEST OF SHOW AWARD 2024
Awarded at the FMS: the Future of Memory and Storage, as the Most Innovative Memory Technology in the DRAM Test System category. Learn More
email us @ sales@xsoptix.com to learn more about the the 55xx platform and the right configuration for your application