Features
- Return loss (RL) and insertion loss (IL) analysis
- Analyze components in reflection and transmission
- Trace distributed RL over length of optical path
- Spectral analysis of RL and IL
- Detect and precisely locate reflective events and measure path length (up to 500 m)
- Speed, resolution and accuracy for optimizing production test
- 20μm sampling resolution
- 12 Hz scan/acquisition rate (80 ms)