Features
- Single measurement, all-parameter analysis of components
- Full characterization of passive devices in under 3 seconds
- Complete polarization response
- With single scan, simultaneously measure:
– Insertion Loss (IL)
– Polarization Dependent Loss (PDL)
– Polarization Mode Dispersion (PMD) and Second Order PMD
– Chromatic Dispersion (CD)
– Group Delay (GD)
– Optical Time Domain Response
– Jones Matrix Elements
– Optical Phase Response - High resolution C and L band (OVA 5100) or O band (OVA 5113) capability
- Real-time measurements
- User-friendly interface
Applications
- Analyze planar light circuits and silicon photonic devices
- Characterize optical fiber components
- Measure both spectral response and time delay response
- Improve device simulations and models with complete transfer function